Accuracy of Measurements Using Max-Zender and Michaelson Interferometer
Keywords:
Measurement accuracy, Max-Zehnder interferometer, Michelson interferometer, light noise, wavelength, path difference, light source stability, noise, optical element stability, mechanical componentsAbstract
The accuracy of measurements using Max-Zehnder and Michelson interferometers is an important topic in the fields of optics and physics. Both interferometers are based on the phenomenon of light interference and are used to measure various parameters such as wavelength of light, length of objects, optical coatings, etc.Downloads
Published
2024-05-10
How to Cite
I. A, A. ., & J. R, K. . (2024). Accuracy of Measurements Using Max-Zender and Michaelson Interferometer. EUROPEAN JOURNAL OF INNOVATION IN NONFORMAL EDUCATION, 4(5), 33–36. Retrieved from http://inovatus.es/index.php/ejine/article/view/3078
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